Motore di ricerca datesheet componenti elettronici
  Italian  ▼
ALLDATASHEETIT.COM

X  

DP8459 Scheda tecnica(PDF) 25 Page - National Semiconductor (TI)

[Old version datasheet] Texas Instruments acquired National semiconductor.
Il numero della parte DP8459
Spiegazioni elettronici  All-Code Data Synchronizer
PDF  35 Pages
Scroll/Zoom Zoom In 100%  Zoom Out
Produttore elettronici  NSC [National Semiconductor (TI)]
Homepage  http://www.national.com
Logo NSC - National Semiconductor (TI)

DP8459 Scheda tecnica(HTML) 25 Page - National Semiconductor (TI)

Back Button DP8459 Datasheet HTML 21Page - National Semiconductor (TI) DP8459 Datasheet HTML 22Page - National Semiconductor (TI) DP8459 Datasheet HTML 23Page - National Semiconductor (TI) DP8459 Datasheet HTML 24Page - National Semiconductor (TI) DP8459 Datasheet HTML 25Page - National Semiconductor (TI) DP8459 Datasheet HTML 26Page - National Semiconductor (TI) DP8459 Datasheet HTML 27Page - National Semiconductor (TI) DP8459 Datasheet HTML 28Page - National Semiconductor (TI) DP8459 Datasheet HTML 29Page - National Semiconductor (TI) Next Button
Zoom Inzoom in Zoom Outzoom out
 25 / 35 page
background image
4.3 WINDOW STROBE
The DP8459 incorporates a window strobe function capable of
shifting the synchronization window either early or late with
respect to its nominal position in small, specified steps. The
strobe step t
S is defined as the controlled time displacement of
the DP8459 synchronization window from its nominal (strobe
centered) position and is typically
t
S = M x [1.8% x τVCO]
where M is the value of the strobe control word (−15 through
+15; see
Figure 4 ) set by the first 5 bits within the Control
Register. (Note that M is equivalent to the hexidecimal value of
the five strobe control bits where bits 0 through 3 are the LSB
through MSB and bit 4 is the sign bit.)
The changing of the strobe value t
S is not an instantaneous
event following the changing of the control word in the Control
Register. The response time of the strobe control circuitry to
any change in strobe setting is a function of the timing
elements connected to the TIMING EXTRACTOR FILTER pin
and the data rate at which the device is being operated. A finite
settling time must be allowed for the delay circuitry to respond
following the loading and latching of the new control word
(latching occurs and strobe changes begin at de-assertion of
CONTROL REGISTER ENABLE, i.e., at transition to logical
ONE). It is recommended that any changes to the strobe
setting be done with READ GATE deasserted and with a
sufficient allowance for settling time prior to the initiation of a
subsequent read operation. Approximate settling times are
given in
Figure 10 for various TEF component values at
specific data rates. (Please refer to AN-578 Window Strobe
Function.)
4.3.1 MARGIN TESTING
The read channel window margin of a disk/tape memory
system is the portion of the synchronization window remaining
after the subtraction of all possible sources of degradation
such as media bit shift, head-amplifier anomalies, pulse
detector anomalies, cable-induced skew, synchronizer losses,
and extraneous noise. The remaining margin must be
sufficient to allow the system to perform with an acceptable
media error rate under all operating conditions. Acceptable
media error rates will vary between systems depending on
ECC codes, data redundancy, and other factors. The
measured value of the synchronization window margin is often
used as a performance criteria for HDA (head-disk assembly)
and read channel qualification, and for gauging the probability
of encountering data errors on the media.
The DP8459 strobe function can be readily used to measure
the window margin within a drive system. Margin tests have
been most frequently employed only during outgoing factory
tests of storage media systems with specialized and costly test
apparatus employed for the purpose; however, the DP8459
allows media/system qualification at any time in the factory or
the field during the system’s operational life, given the
incorporation of an appropriate margin test algorithm within the
disk system controller. The algorithm may be configured first to
record
the
most
bit-interactive
(shift-producing)
pattern
possible with the recording code being employed (eg., a
repeating hex 6D B6 pattern in MFM) in an area of the media
where recording density is its highest (inner-most track in
constant-angular velocity or constant data rate disk systems),
and secondly to read the track repeatedly while incremently
advancing the degree of window “strobe” (controlled shift) first
in the early direction until the data error rate crosses a
pre-determined threshold and then in the late direction until the
same threshold is again crossed. The smaller of the two
DP8459 window strobe measurements (either the early or the
late value) determined at the error rate threshold crossing
points is then equal to the read channel window margin.
http:\\www.national.com
25
PrintDate=1996/07/31 PrintTime=11:06:11 ds009322 Rev. No. 1
Proof
25



Html Pages

1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35


Scheda tecnica Scarica

Go To PDF Page


Link URL



Lei ha avuto il aiuto da alldatasheet?  [ DONATE ] 

Di alldatasheet   |   Richest di pubblicita   |   contatti   |   Privacy Policy   |   Collegamento alla scheda tecnica    |   scambio Link   |   Ricerca produttore
All Rights Reserved©Alldatasheet.com


Mirror Sites
English : Alldatasheet.com  |   English : Alldatasheet.net  |   Chinese : Alldatasheetcn.com  |   German : Alldatasheetde.com  |   Japanese : Alldatasheet.jp
Russian : Alldatasheetru.com  |   Korean : Alldatasheet.co.kr  |   Spanish : Alldatasheet.es  |   French : Alldatasheet.fr  |   Italian : Alldatasheetit.com
Portuguese : Alldatasheetpt.com  |   Polish : Alldatasheet.pl  |   Vietnamese : Alldatasheet.vn
Indian : Alldatasheet.in  |   Mexican : Alldatasheet.com.mx  |   British : Alldatasheet.co.uk  |   New Zealand : Alldatasheet.co.nz
Family Site : ic2ic.com  |   icmetro.com