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DP8459 Scheda tecnica(PDF) 25 Page - National Semiconductor (TI) |
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DP8459 Scheda tecnica(HTML) 25 Page - National Semiconductor (TI) |
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25 / 35 page ![]() 4.3 WINDOW STROBE The DP8459 incorporates a window strobe function capable of shifting the synchronization window either early or late with respect to its nominal position in small, specified steps. The strobe step t S is defined as the controlled time displacement of the DP8459 synchronization window from its nominal (strobe centered) position and is typically t S = M x [1.8% x τVCO] where M is the value of the strobe control word (−15 through +15; see Figure 4 ) set by the first 5 bits within the Control Register. (Note that M is equivalent to the hexidecimal value of the five strobe control bits where bits 0 through 3 are the LSB through MSB and bit 4 is the sign bit.) The changing of the strobe value t S is not an instantaneous event following the changing of the control word in the Control Register. The response time of the strobe control circuitry to any change in strobe setting is a function of the timing elements connected to the TIMING EXTRACTOR FILTER pin and the data rate at which the device is being operated. A finite settling time must be allowed for the delay circuitry to respond following the loading and latching of the new control word (latching occurs and strobe changes begin at de-assertion of CONTROL REGISTER ENABLE, i.e., at transition to logical ONE). It is recommended that any changes to the strobe setting be done with READ GATE deasserted and with a sufficient allowance for settling time prior to the initiation of a subsequent read operation. Approximate settling times are given in Figure 10 for various TEF component values at specific data rates. (Please refer to AN-578 Window Strobe Function.) 4.3.1 MARGIN TESTING The read channel window margin of a disk/tape memory system is the portion of the synchronization window remaining after the subtraction of all possible sources of degradation such as media bit shift, head-amplifier anomalies, pulse detector anomalies, cable-induced skew, synchronizer losses, and extraneous noise. The remaining margin must be sufficient to allow the system to perform with an acceptable media error rate under all operating conditions. Acceptable media error rates will vary between systems depending on ECC codes, data redundancy, and other factors. The measured value of the synchronization window margin is often used as a performance criteria for HDA (head-disk assembly) and read channel qualification, and for gauging the probability of encountering data errors on the media. The DP8459 strobe function can be readily used to measure the window margin within a drive system. Margin tests have been most frequently employed only during outgoing factory tests of storage media systems with specialized and costly test apparatus employed for the purpose; however, the DP8459 allows media/system qualification at any time in the factory or the field during the system’s operational life, given the incorporation of an appropriate margin test algorithm within the disk system controller. The algorithm may be configured first to record the most bit-interactive (shift-producing) pattern possible with the recording code being employed (eg., a repeating hex 6D B6 pattern in MFM) in an area of the media where recording density is its highest (inner-most track in constant-angular velocity or constant data rate disk systems), and secondly to read the track repeatedly while incremently advancing the degree of window “strobe” (controlled shift) first in the early direction until the data error rate crosses a pre-determined threshold and then in the late direction until the same threshold is again crossed. The smaller of the two DP8459 window strobe measurements (either the early or the late value) determined at the error rate threshold crossing points is then equal to the read channel window margin. http:\\www.national.com 25 PrintDate=1996/07/31 PrintTime=11:06:11 ds009322 Rev. No. 1 Proof 25 |
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