MCP3202

DS21034D-page 2

© 2006 Microchip Technology Inc.

1.0

ELECTRICAL

CHARACTERISTICS

1.1

Maximum Ratings*

V

All inputs and outputs w.r.t. V

Storage temperature ..........................-65°C to +150°C

Ambient temp. with power applied .....-65°C to +125°C

ESD protection on all pins (HBM)

......................... > 4kV

*Notice: Stresses above those listed under “Maximum Ratings” may

cause permanent damage to the device. This is a stress rating only

and functional operation of the device at those or any other conditions

above those indicated in the operational listings of this specification is

not implied. Exposure to maximum rating conditions for extended

periods may affect device reliability.

PIN FUNCTION TABLE

Name

Function

V

+2.7V to 5.5V Power Supply and

Reference Voltage Input

CH0

Channel 0 Analog Input

CH1

Channel 1 Analog Input

CLK

Serial Clock

D

IN

Serial Data In

D

OUT

Serial Data Out

CS/SHDN

Chip Select/Shutdown Input

ELECTRICAL CHARACTERISTICS

All parameters apply at V

unless otherwise noted.

Parameter

Sym

Min.

Typ.

Max.

Units

Conditions

Conversion Rate:

Conversion Time

t

CONV

—

—

12

clock

cycles

Analog Input Sample Time

t

SAMPLE

1.5

clock

cycles

Throughput Rate

f

SAMPLE

—

—

—

—

100

50

ksps

ksps

V

V

DC Accuracy:

Resolution

12

bits

Integral Nonlinearity

INL

—

—

±0.75

±1

±1

±2

LSB

LSB

MCP3202-B

MCP3202-C

Differential Nonlinearity

DNL

—

±0.5

±1

LSB

No missing codes over

temperature

Offset Error

—

±1.25

±3

LSB

Gain Error

—

±1.25

±5

LSB

Dynamic Performance:

Total Harmonic Distortion

THD

—

-82

—

dB

V

Signal to Noise and Distortion

(SINAD)

SINAD

—

72

—

dB

V

Spurious Free Dynamic Range

SFDR

—

86

—

dB

V

Analog Inputs:

Input Voltage Range for CH0 or

CH1 in Single-Ended Mode

V

SS

—V

DD

V

Input Voltage Range for IN+ in

Pseudo-Differential Mode

IN+

IN-

—

V

See Sections 3.1 and 4.1

Input Voltage Range for IN- in

Pseudo-Differential Mode

IN-

V

—

V

mV

See Sections 3.1 and 4.1

Leakage Current

—

.001

±1

μA

Switch Resistance

R

SS

—1 k

—

Ω

See Figure 4-1

Note 1: This parameter is established by characterization and not 100% tested.

2: Because the sample cap will eventually lose charge, effective clock rates below 10 kHz can affect linearity

performance, especially at elevated temperatures. See Section 6.2 for more information.