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Motore di ricerca datesheet componenti elettronici |
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Motore di ricerca datesheet componenti elettronici |
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JS28F256P30T85 Scheda tecnica(PDF) 33 Page - Intel Corporation |
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JS28F256P30T85 Scheda tecnica(HTML) 33 Page - Intel Corporation |
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33 / 102 page  1-Gbit P30 Family Datasheet Intel StrataFlash® Embedded Memory (P30) April 2005 Order Number: 306666, Revision: 001 33 7.0 AC Characteristics 7.1 AC Test Conditions Note: AC test inputs are driven at VCCQ for Logic "1" and 0.0 V for Logic "0." Input/output timing begins/ends at VCCQ/2. Input rise and fall times (10% to 90%) < 5 ns. Worst case speed occurs at VCC = VCCMin. NOTES: 1. See the following table for component values. 2. Test configuration component value for worst case speed conditions. 3. CL includes jig capacitance . Figure 13. AC Input/Output Reference Waveform Input V CCQ/2 V CCQ/2 Output V CCQ 0V Test Points Figure 14. Transient Equivalent Testing Load Circuit Device Under Test Out C L Table 14. Test configuration component value for worst case speed conditions Test Configuration CL (pF) VCCQMin Standard Test 30 Figure 15. Clock Input AC Waveform CLK [C] V IH V IL R203 R202 R201 |
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