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EVAL-ADF7020DBZ2 Scheda tecnica(PDF) 45 Page - Analog Devices

Il numero della parte EVAL-ADF7020DBZ2
Spiegazioni elettronici  High Performance, ISM Band, FSK/ASK Transceiver IC
PDF  48 Pages
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Produttore elettronici  AD [Analog Devices]
Homepage  http://www.analog.com
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EVAL-ADF7020DBZ2 Scheda tecnica(HTML) 45 Page - Analog Devices

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Data Sheet
ADF7020
Rev. D | Page 45 of 48
REGISTER 12—TEST REGISTER
DIGITAL
TEST MODES
Σ-Δ
TEST MODES
ANALOG TEST
MUX
MANUAL FILTER CAL
PLL TEST MODES
ADDRESS
BITS
P
0
1
PRESCALER
4/5 (DEFAULT)
8/9
CR1
0
1
COUNTER RESET
DEFAULT
RESET
CS1
0
1
CAL SOURCE
INTERNAL
SERIAL IF BW CAL
DEFAULT = 32. INCREASE
NUMBER TO INCREASE BW
IF USER CAL ON
Figure 57. Register 12—Test Register
Register 12—Test Register Comments
This register does not need to be written to in normal
operation. The default test mode is 0x0000 000C, which puts
the part in normal operation.
Using the Test DAC on the ADF7020 to Implement
Analog FM Demodulation and Measuring of SNR
The test DAC allows the output of the postdemodulator filter
for both the linear and correlator/demodulators (see Figure 30
and Figure 31) to be viewed externally. It takes the 16-bit filter
output and converts it to a high frequency, single-bit output
using a second-order Σ-Δ converter. The output can be viewed
on the CLKOUT pin. This signal, when filtered appropriately,
can then be used to
•
Monitor the signals at the FSK/ASK postdemodulator filter
output. This allows the demodulator output SNR to be
measured. Eye diagrams can also be constructed of the
received bit stream to measure the received signal quality.
•
Provide analog FM demodulation.
While the correlators and filters are clocked by DEMOD_CLK,
CDR_CLK clocks the test DAC. Note that although the test
DAC functions in a regular user mode, the best performance is
achieved when the CDR_CLK is increased up to or above the
frequency of DEMOD_CLK. The CDR block does not function
when this condition exists.
Programming the test register, Register 12, enables the test
DAC. In correlator mode, this can be done by writing to Digital
Test Mode 7 or 0x0001C00C.
To view the test DAC output when using the linear demodu-
lator, the user must remove a fixed offset term from the signal
using Register 13. This offset is nominally equal to the IF
frequency. The user can determine the value to program by
using the frequency error readback to determine the actual IF
and then programming half this value into the offset removal
field. It also has a signal gain term to allow the usage of the
maximum dynamic range of the DAC.
Setting Up the Test DAC
•
Digital test modes = 7: enables the test DAC, with no offset
removal (0x0001 C00C).
•
Digital test modes = 10: enables the test DAC, with offset
removal (needed for linear demodulation only, 0x02 800C).
The output of the active demodulator drives the DAC, that is, if
the FSK correlator/demodulator is selected, the correlator filter
output drives the DAC.
The evaluation boards for the ADF7020 contain land patterns
for placement of an RC filter on the CLKOUT line. This is
typically designed so that the cut-off frequency of the filter is
above the demodulated data rate.



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