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SCANSTA101SM/NOPB Scheda tecnica(PDF) 21 Page - Texas Instruments

Il numero della parte SCANSTA101SM/NOPB
Spiegazioni elettronici  SCANSTA101 Low Voltage IEEE 1149.1 System Test Access (STA) Master
PDF  42 Pages
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SCANSTA101SM/NOPB Scheda tecnica(HTML) 21 Page - Texas Instruments

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SCANSTA101
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SNLS057J – MAY 2002 – REVISED APRIL 2013
WRITING AND READING PARTIAL LONG WORDS
Care should be taken when writing a partial long word to TDO_SM memory or reading a partial long word from
TDI_SM memory. Since the TDO_SM shifter shifts out LSB first, the valid (meaningful) bits within a partial long
word (i.e., long word containing less than 32 valid bits to be shifted to the scan chain) must be stored and written
into the memory as the least significant bits. This will assure that the desired bits will be accurately loaded into
the TDO_SM shifter and shifted out to the boundary scan chain. For instance, to shift a 3-bit (110) sequence the
partial long word should be written to the TDO_SM memory as shown in Figure 10 (only the least significant 16
bits are shown). A subsequent enable and load of the vector structure with the correct length will initialize the
shift operation and only the bits that are significant will be shifted out to the scan chain.
Figure 10. Writing a Partial Long Word to the TDO_SM Memory
Data is shifted from the scan chain into the TDI_SM shifter from MSB to LSB. Consequently, the valid
(meaningful) bits in a partial long word shifted into the TDI_SM shifter will reside in the upper significant bit
locations. For example, if a scan operation involves shifting and evaluating 69 bits returning to TDI_SM, the
TDI_SM memory will be loaded with two long words (i.e., two full long words plus a partial long word containing 5
meaningful bits). If the last 5 bits shifted back to the TDI_SM shifter are 11010, then upon completion of the shift
operation, the TDI_SM shifter will contain the following partial long word as shown in Figure 11 (only the most
significant 16 bits are shown), which will subsequently be loaded into the TDI_SM memory.
Following a read of a partial long word, the embedded test software must adjust the position of the valid bits read
from the TDI_SM shifter/buffer or the position of the expected data to assure that an accurate comparison is
made (and the non-meaningful bits are masked).
Figure 11. Reading a Partial Long Word from the TDI_SM Memory
TDO_SM IMPLEMENTATION
The behavior of the TDO_SM output depends on the macro type that is being processed and the SETUP register
bits 11 and 10, as shown in Table 12, regardless of the TAP tracker state. For shift macros, the TDO_SM output
also depends on the current macro structure's TMS_SM bit number as explained below.
Table 12. TDO_SM Output Behavior
SETUP[11:10]
TDO_SM
00
Hold Previous value
01 or 10
Default TDO value (Bit 6 of the SETUP register) (1)
11
High Impedance
(1)
Default TDO value (bit 6 of the SETUP register) may be set to a 0 when SETUP[11:10]=01 and to a 1 when SETUP[11:10]=10.
For BIST and STATE macros, the TDO_SM output behaves as shown in the above table.
For the shift macros, with or without capture, the TDO_SM output behaves as per the table only when the
corresponding TMS_SM output is not driven by the macro structure bit 7 or 8. On each falling edge of the
TCK_SM following the TCK_SM falling edge on which the TMS_SM changes state from bit 6 of the macro
structure to bit 7 of the macro structure, the serial test vector data fetched from the memory is presented on the
TDO_SM output. On the falling edge of the TCK_SM on which the final bit of the test vector is presented on the
TDO_SM output, the TMS_SM is presented with macro structure bit 8. On the subsequent TCK_SM falling
edges, and on the TCK_SM falling edges before the TMS_SM changes state from bit 6 to bit 7 of the macro
structure, the TDO_SM will behave as per the table above.
Copyright © 2002–2013, Texas Instruments Incorporated
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