MC9S08DZ96F2CLL datasheet(79/458 Pages) FREESCALE

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Chapter 4 Memory

MC9S08DZ128 Series Data Sheet, Rev. 1

Freescale Semiconductor

4.6.11.3

FLASH and EEPROM Conﬁguration Register (FCNFG)

EPGMOD

EEPROM Sector Mode — When this bit is 0, each sector is split into two pages (4-byte mode). When this bit is

1, each sector is in a single page (8-byte mode).

0 Half of each EEPROM sector is in Page 0 and the other half is in Page 1.

1 Each sector is in a single page.

1:0

SEC

Security State Code — This 2-bit ﬁeld determines the security state of the MCU as shown in Table 4-16. When

the MCU is secure, the contents of RAM, EEPROM and FLASH memory cannot be accessed by instructions

from any unsecured source including the background debug interface. SEC changes to 1:0 after successful

backdoor key entry or a successful blank check of FLASH. For more detailed information about security, refer to

Section 4.6.9, “Security.”

Table 4-16. Security States1

1 SEC changes to 1:0 after successful backdoor key entry

or a successful blank check of FLASH.

SEC[1:0]

Description

0:0

secure

0:1

secure

1:0

unsecured

1:1

secure

76543210

EPGSEL

KEYACC

10001

Reset

00010001

= Unimplemented or Reserved

Figure 4-16. FLASH and EEPROM Conﬁguration Register (FCNFG)

Table 4-17. FCNFG Register Field Descriptions

Field

Description

EPGSEL

EEPROM Page Select — This bit selects which EEPROM page is accessed in the memory map.

0 Page 0 is in foreground of memory map. Page 1 is in background and can not be accessed.

1 Page 1 is in foreground of memory map. Page 0 is in background and can not be accessed.

KEYACC

Enable Writing of Access Key — This bit enables writing of the backdoor comparison key. For more detailed

information about the backdoor key mechanism, refer to Section 4.6.9, “Security.”

0 Writes to 0xFFB0–0xFFB7 are interpreted as the start of a FLASH programming or erase command.

1 Writes to NVBACKKEY (0xFFB0–0xFFB7) are interpreted as comparison key writes.

Table 4-15. FOPT Register Field Descriptions

Field

Description

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