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H8S/2218 Scheda tecnica(PDF) 499 Page - Renesas Technology Corp |
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H8S/2218 Scheda tecnica(HTML) 499 Page - Renesas Technology Corp |
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499 / 750 page ![]() Section 13 Boundary Scan Function Rev.6.00 Jun. 03, 2008 Page 451 of 698 REJ09B0074-0600 13.2 Pin Configuration Table 13.1 shows the I/O pins used in the boundary scan function. Table 13.1 Pin Configuration Pin Name I/O Function TMS Input Test Mode Select Controls the TAP controller which is a 16-state Finite State Machine. The TMS input value at the rising edge of TCK determines the status transition direction on the TAP controller. The TMS is fixed high when the boundary scan function is not used. The protocol is based on JTAG standard (IEEE Std.1149.1). This pin has a pull-up resistor. TCK Input Test Clock A clock signal for the boundary scan function. When the boundary scan function is used, input a clock of 50% duty to this pin. This pin has a pull-up resistor. TDI Input Test Data Input A data input signal for the boundary scan function. Data input from the TDI is latched at the rising edge of TCK. TDI is fixed high when the boundary scan function is not used. This pin has a pull-up register. TDO Output Test Data Output A data output signal for the boundary scan function. Data output from the TDO changes at the falling edge of TCK. The output driver of the TDO is driven only when it is necessary only in Shift-IR or Shift-DR states, and is brought to the high- impedance state when not necessary. TRST Input Test Reset Asynchronously resets the TAP controller when TRST is brought low. The user must apply power-on reset signal specific to the boundary scan function when the power is supplied. (For details on signal design, refer to section 13.5, Usage Notes.) This pin has a pull-up resister. |
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