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R5F572TFGDFP Scheda tecnica(PDF) 102 Page - Renesas Technology Corp |
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R5F572TFGDFP Scheda tecnica(HTML) 102 Page - Renesas Technology Corp |
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102 / 120 page ![]() R01DS0331EJ0110 Rev.1.10 Page 102 of 120 Oct 06, 2023 RX72T Group 2. Electrical Characteristics 2.6 A/D Conversion Characteristics Note: The above specification values apply when there is no access to the external bus during A/D conversion. If access proceeds during A/D conversion, values may not fall within the above ranges. Note 1. When PCLKD was higher than 40 MHz, 0.01-µF capacitors were placed in parallel with the 0.1-µF capacitors between AVCC0 and AVSS0, AVCC1 and AVSS1, and AVCC2 and AVSS2 for measurement of the A/D conversion characteristics. Note 2. The conversion time is the sum of the sampling time and the comparison time. The numbers of sampling-clock cycles are indicated as the test conditions. Table 2.44 12-Bit A/D (Unit 0, 1, 2) Conversion Characteristics (1) Conditions: VCC = 2.7 to 5.5 V, VCC_USB = 2.7 to 5.5 V, 4.5 V ≤ AVCC0 = AVCC1 = AVCC2 ≤ 5.5V, VSS = VSS_USB = AVSS0 = AVSS1 = AVSS2 = 0 V, Ta = Topr, PCLKB = PCLKD = 8 to 60 MHz*1, Source impedance = 1.0 kΩ Item Min. Typ. Max. Unit Test Conditions Resolution 12 12 12 Bit Analog input capacitance — — 30 pF Conversion time*2 (Operation at PCLKD = 60 MHz) AN000 to AN002, AN100 to AN102 Channel-dedicated sample-and-hold circuits in use Constant sampling enabled 1.00 — — µs Sampling time: 24 PCLKD Constant sampling disabled 1.40 — — Sampling time of channel-dedicated sample-and-hold circuits: 24 PCLKD Sampling time: 24 PCLKD Channel-dedicated sample-and- hold circuits not in use 0.90 — — Sampling time: 30 PCLKD AN003 to AN006, AN103 to AN106 0.90 — — Sampling time: 30 PCLKD AN007, AN107, AN200 to AN211 0.95 — — Sampling time: 33 PCLKD AN216 to AN217 1.05 — — Sampling time: 39 PCLKD Offset error Channel-dedicated sample-and- hold circuits in use — ±1.5 ±6.0 LSB AN000 to AN002, AN100 to AN102 = 0.2 V Channel-dedicated sample-and- hold circuits not in use — ±1.5 ±5.0 Full-scale error Channel-dedicated sample-and- hold circuits in use — ±1.5 ±5.5 AN000 to AN002 = AVCC0 – 0.2 V AN100 to AN102 = AVCC1 – 0.2 V Channel-dedicated sample-and- hold circuits not in use — ±1.5 ±4.5 Quantization error Channel-dedicated sample-and- hold circuits in use —±0.5 — Channel-dedicated sample-and- hold circuits not in use —±0.5 — Absolute accuracy AN000 to AN002, AN100 to AN102 Channel-dedicated sample-and- hold circuits in use — ±3.0 ±6.0 Channel-dedicated sample-and- hold circuits not in use — ±2.5 ±5.5 AN003 to AN007, AN103 to AN107 — ±2.5 ±5.5 AN200 to AN211 — ±2.5 ±5.5 AN216 to AN217 — ±2.5 ±6.5 DNL differential nonlinearity error Channel-dedicated sample-and- hold circuits in use — ±1.0 ±2.5 Channel-dedicated sample-and- hold circuits not in use — ±1.0 ±1.5 INL integral nonlinearity error Channel-dedicated sample-and- hold circuits in use — ±1.5 ±4.0 Channel-dedicated sample-and- hold circuits not in use — ±1.5 ±2.5 Holding time of the channel-dedicated sample-and-hold circuit — — 20 µs Dynamic range AN000 to AN002 Channel-dedicated sample-and- hold circuits in use 0.2 — AVCC0 – 0.2 V AN100 to AN102 Channel-dedicated sample-and- hold circuits in use 0.2 — AVCC1 – 0.2 |
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