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CDPCLK4 Scheda tecnica(PDF) 270 Page - Altera Corporation |
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CDPCLK4 Scheda tecnica(HTML) 270 Page - Altera Corporation |
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270 / 274 page ![]() 12–6 Chapter 12: IEEE 1149.1 (JTAG) Boundary-Scan Testing for the Cyclone III Device Family Guidelines for IEEE Std. 1149.1 BST Cyclone III Device Handbook December 2011 Altera Corporation Volume 1 Figure 12–1 shows the JTAG chain of mixed voltages and how a level shifter is inserted in the chain. Guidelines for IEEE Std. 1149.1 BST Use the following guidelines when performing BST with IEEE Std. 1149.1 devices: ■ If the 10 bit checkerboard pattern (1010101010) does not shift out of the instruction register via the TDO pin during the first clock cycle of the SHIFT_IR state, the TAP controller did not reach the proper state. To solve this problem, try one of the following procedures: ■ Verify that the TAP controller has reached the SHIFT_IR state correctly. To advance the TAP controller to the SHIFT_IR state, return to the RESET state and send the code 01100 to the TMS pin. ■ Check the connections to the VCC, GND, JTAG, and dedicated configuration pins on the device. ■ Perform a SAMPLE/PRELOAD test cycle prior to the first EXTEST test cycle to ensure that known data is present at the device pins when you enter the EXTEST mode. If the OEJ update register contains a 0, the data in the OUTJ update register is driven out. The state must be known and correct to avoid contention with other devices in the system. ■ Do not perform EXTEST testing during ICR. This instruction is supported before or after ICR, but not during ICR. Use the CONFIG_IO instruction to interrupt configuration and then perform testing, or wait for configuration to complete. ■ If testing is performed before configuration, hold the nCONFIG pin low. Figure 12–1. JTAG Chain of Mixed Voltages Tester 3.3 V VCCIO 2.5 V VCCIO 1.5 V VCCIO 1.8 V VCCIO Level Shifter Shift TDO to level accepted by tester if necessary Must be 1.8 V tolerant Must be 2.5 V tolerant Must be 3.3 V tolerant TDI TDO |
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