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L9965P Scheda tecnica(PDF) 70 Page - STMicroelectronics |
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L9965P Scheda tecnica(HTML) 70 Page - STMicroelectronics |
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70 / 104 page ![]() Table 53. DEPLOY_DIAG_STATUS_0 - 0x09 Field name Type Bit offset Bit width Reset value Reset sources Description PR_STB CR 9 1 0x0 nPOR_MAIN 0 = PR leakage test good 1 = PR leakage test fails (PR STB) PR_STG CR 8 1 0x0 nPOR_MAIN 0 = PR leakage test good 1 = PR leakage test fails (PR STG) PF_STB CR 7 1 0x0 nPOR_MAIN 0 = PF leakage test good 1 = PF leakage test fails (PF STB) PF_STG CR 6 1 0x0 nPOR_MAIN 0 = PF leakage test good 1 = PF leakage test fails (PF STG) VRCM_STG_FAIL CR 5 1 0x0 nPOR_MAIN 0 = VRCM STG comparator selftest good 1 = VRCM STG comparator selftest fails VRCM_STB_FAIL CR 4 1 0x0 nPOR_MAIN 0 = VRCM STB comparator selftest good 1 = VRCM STB comparator selftest fails PR_FET_STB CR 3 1 0x0 nPOR_MAIN 0 = PR FET test good 1 = PR FET test fail (STB) PR_FET_FAIL CR 2 1 0x0 nPOR_MAIN 0 = PR FET test good 1 = PR FET test fail (timeout) PF_FET_STG CR 1 1 0x0 nPOR_MAIN 0 = PF FET test good 1 = PF FET test fails (STG) PF_FET_FAIL CR 0 1 0x0 nPOR_MAIN 0 = PF FET test good 1 = PF FET test fail (timeout) Table 54. DEPLOY_DIAG_STATUS_1 - 0x0A Field name Type Bit offset Bit width Reset value Reset sources Description UNUSED RO 7 3 0x1 nPOR_MAIN PF_PR_PRE_HWSC_FAIL CR 6 1 0x0 nPOR_MAIN 0 = PF vs PR PRE HWSC test good 1 = PF vs PR PRE HWSC test fail PF_PR_POST_HWSC_FAIL CR 5 1 0x0 nPOR_MAIN 0 = PF vs PR POST HWSC test good 1 = PF vs PR POST HWSC test fail VRCM_HWSC_FAIL CR 4 1 0x0 nPOR_MAIN 0 = VRCM HWSC test good 1 = VRCM HWSC test fails PS_OV CR 3 1 0x0 nPOR_MAIN 0 = PS below OV threshold 1 = PS above OV threshold PS_UV CR 2 1 0x0 nPOR_MAIN 0 = PS above UV threshold 1 = PS below UV threshold PYRO_HIGH_RES CR 1 1 0x0 nPOR_MAIN 0 = pyro resistance test good 1 = pyro res above high threshold PYRO_LOW_RES CR 0 1 0x0 nPOR_MAIN 0 = pyro resistance test good 1 = pyro res below low threshold L9965P Functional description DS14702 - Rev 4 page 70/104 |
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