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LMKDB1104FS Scheda tecnica(PDF) 25 Page - Texas Instruments |
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LMKDB1104FS Scheda tecnica(HTML) 25 Page - Texas Instruments |
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25 / 133 page ![]() 6.5 Electrical Characteristics (continued) over operating free-air temperature range (unless otherwise noted) PARAMETER TEST CONDITIONS MIN TYP MAX UNIT VOH,DC Output voltage high with DC test load DB2000QL DC test load(2) 225 270 mV VOL,DC Output voltage low with DC test load 10 150 mV Vovs,DC Output overshoot voltage with DC test load 75 mV Vuds,DC Output undershoot voltage with DC test load –75 mV Zdiff Differential output impedance Measured at VOL/VOH, VDD = 3.3 V 80.75 85 89.25 Ω Measured at VOL/VOH, VDD = 1.8 V 81 85 90 Ω Zdiff Differential output impedance Measured at VOL/VOH, VDD = 3.3 V, TA= 0 ℃ to 105℃ 80.75 85 89.25 Ω Measured at VOL/VOH, VDD = 1.8 V, TA= 0 ℃ to 105℃ 81 85 90 Ω Zdiff Differential output impedance Min swing, VDD = 3.3 V 80 88.5 Ω Zdiff Differential output impedance Max swing, VDD = 3.3 V 86.5 106.5 Ω Zdiff Differential output impedance Min swing, VDD = 1.8 V 80 89 Ω Zdiff Differential output impedance Max swing, VDD = 1.8 V 88 112.5 Ω Zdiff- crossing Differential output impedance - crossing Measured during transition 68 85 102 Ω dV/dt Output slew rate Min swing. Default slew rate setting 2.4 2.85 V/ns dV/dt Output slew rate Max swing. Default slew rate setting 3.5 4.8 V/ns dV/dt Output slew rate Measured from –150 mV to +150 mV on the differential waveform. Lowest slew rate(6) (7) 1.3 2.2 V/ns Measured from –150 mV to +150 mV on the differential waveform. Low slew rate(6) (7) 2.5 3 V/ns Measured from –150 mV to +150 mV on the differential waveform. High slew rate (default)(6) (7) 3 3.5 V/ns Measured from –150 mV to +150 mV on the differential waveform. Highest slew rate(6) (7) 2.4 4 V/ns ∆dV/dt Rising edge rate to falling edge rate matching DB2000QL AC test load(6) 10 % DCD Duty cycle distortion Measured on the differential waveform. Input duty cycle = 50%(6) –1 1 % Vcross,AC Absolute crossing point voltage DB2000QL AC test load(6) 250 550 mV Vcross,DC Absolute crossing point voltage DB2000QL DC test load(2) 130 200 mV ∆Vcross,A C Variation of Vcross over all clock edges DB2000QL AC test load(6) 140 mV ∆Vcross- DC Variation of Vcross over all clock edges DB2000QL DC test load(2) 35 mV |VRB| Absolute value of ring back voltage as defined in PCIe DB2000QL AC test load(6) 100 mV VRB Ring back voltage as defined in DB800ZL DB2000QL AC test load(6) –200 200 mV tstable Time before VRB is allowed DB2000QL AC test load(6) 500 ps CLOCK OUTPUT CHARACTERISTICS - non-PCIe (LMKDB1120FS, LMKDB1108FS, LMKDB1104FS) VOH Output voltage high Output swing programmed to 800 mV. f0 = 156.25 MHz or 312.5 MHz 720 890 mV VOL Output voltage low –120 120 mV www.ti.com LMKDB1102, LMKDB1104, LMKDB1104FS, LMKDB1108, LMKDB1108FS LMKDB1112, LMKDB1120, LMKDB1120FS SNAS855G – NOVEMBER 2023 – REVISED MAY 2026 Copyright © 2026 Texas Instruments Incorporated Submit Document Feedback 25 Product Folder Links: LMKDB1102 LMKDB1104 LMKDB1104FS LMKDB1108 LMKDB1108FS LMKDB1112 LMKDB1120 LMKDB1120FS |
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