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IMX53IEC Scheda tecnica(PDF) 17 Page - Freescale Semiconductor, Inc |
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IMX53IEC Scheda tecnica(HTML) 17 Page - Freescale Semiconductor, Inc |
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17 / 173 page ![]() Electrical Characteristics i.MX53 Applications Processors for Industrial Products, Rev. 6 Freescale Semiconductor 17 4.1.2 Thermal Resistance 4.1.2.1 TEPBGA-2 Package Thermal Resistance Table 5 provides the TEPBGA-2 package thermal resistance data. Input voltage on USB_OTG_DP, USB_OTG_DN, USB_H1_DP, USB_H1_DN pins USB_DP/USB_DN -0.3 3.631 V Input/Output Voltage Range Vin/Vout -0.5 OVDD +0.32 V ESD Damage Immunity: Vesd V • Human Body Model (HBM) • Charge Device Model (CDM) — — 2000 500 Storage Temperature Range TSTORAGE -40 150 oC 1 USB_DN and USB_DP can tolerate 5 V for up to 24 hours. 2 The term OVDD in this section refers to the associated supply rail of an input or output. The association is described in Table 111 on page 148. The maximum range can be superseded by the DC tables. Table 5. TEPBGA-2 Package Thermal Resistance Data Rating Board Symbol Value Unit Junction to Ambient (natural convection)1, 2 1 Junction temperature is a function of die size, on-chip power dissipation, package thermal resistance, mounting site (board) temperature, ambient temperature, air flow, power dissipation of other components on the board, and board thermal resistance. 2 Per JEDEC JESD51-2 with the single layer board horizontal. Board meets JESD51-9 specification. Single layer board (1s) RθJA 28 °C/W Junction to Ambient (natural convection)1, 2, 3 3 Per JEDEC JESD51-6 with the board horizontal. Four layer board (2s2p) RθJA 16 °C/W Junction to Ambient (at 200 ft/min)1, 3 Single layer board (1s) RθJMA 21 °C/W Junction to Ambient (at 200 ft/min)1, 3 Four layer board (2s2p) RθJMA 13 °C/W Junction to Board4 4 Thermal resistance between the die and the printed circuit board per JEDEC JESD51-8. Board temperature is measured on the top surface of the board near the package. —RθJB 6°C/W Junction to Case5 5 Thermal resistance between the die and the case top surface as measured by the cold plate method (MIL SPEC-883 Method 1012.1). —RθJC 4°C/W Junction to Package Top (natural convection)6 6 Thermal characterization parameter indicating the temperature difference between package top and the junction temperature per JEDEC JESD51-2. — ΨJT 4°C/W Table 4. Absolute Maximum Ratings (continued) Parameter Description Symbol Min Max Unit |
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