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H8S/2224 Scheda tecnica(PDF) 45 Page - Renesas Technology Corp |
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H8S/2224 Scheda tecnica(HTML) 45 Page - Renesas Technology Corp |
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45 / 1071 page ![]() Rev. 5.00 Aug 08, 2006 page xlv of lxxxvi Item Page Revision (See Manual for Details) 27.3.6 Flash Memory Characteristics Table 27.25 Flash Memory Characteristics 886 Notes 6 and 7 amended, note 8 added Notes: 6. The minimum times that all characteristics after rewriting are guaranteed. (A range between 1 and minimum value is guaranteed.) 7. The reference value at 25°C. (Normally, it is a reference that rewriting is enabled up to this value.) 8. Data hold characteristics when rewriting is performed within the range of specifications including minimum value. 27.4 Electrical Characteristics of H8S/2238B and H8S/2236B 887 Section 27.4 title amended 27.4.2 DC Characteristics Table 27.27 DC Characteristics (1) 889 Note 2 amended Note: 2. In order to output high level, a pull-up resistance must be connected externally. 27.4.6 Flash Memory Characteristics Table 27.37 Flash Memory Characteristics 905 Table 27.37 amended Item Symbol Min Typ Max Unit Test Conditions Programming time* 1*2*4 tP 10 200 ms/ 128 bytes Erase time* 1*3*5 tE 100 1200 ms/block Rewrite times NWEC 100* 6 10000* 7 Times Data holding time* 8 tDRP 10 Years 906 Notes 6 and 7 amended, note 8 added Notes: 6. The minimum times that all characteristics after rewriting are guaranteed. (A range between 1 and minimum value is guaranteed.) 7. The reference value at 25°C. (Normally, it is a reference that rewriting is enabled up to this value.) 8. Data hold characteristics when rewriting is performed within the range of specifications including minimum value. 924 Table 27.48 amended Absolute accuracy* 27.5.5 D/A Conversion Characteristics Table 27.48 D/A Conversion Characteristics Note * added Note: * Does not apply in module stop mode, software standby mode, watch mode, subactive mode, or subsleep mode. 27.5.6 Flash Memory Characteristics Table 27.49 Flash Memory Characteristics 925 Table 27.49 amended Item Symbol Min Typ Max Unit Test Conditions Programming time* 1*2*4 tP 10 200 ms/128 bytes Erase time* 1*3*5 tE 100 1200 ms/block Reprogramming count NWEC *6 *8 100 10000* 7 Times Data holding time tDRP 10 year |
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