PIIX datasheet(118/122 Pages) INTEL

118 / 122 page

82371FB (PIIX) AND 82371SB (PIIX3)

118

5.0.

TESTABILITY (PIIX/PIIX3)

5.1.

Test Mode Description

The test modes are decoded from the IRQ inputs (IRQ 7, 6, 5) and qualified with the TESTIN# pin. Test mode

selection is asynchronous. These signals need to remain in their respective state for the duration of the test

modes. The test modes are defined as follows.

Table 17. Test Modes

Test Mode

IRQ7

IRQ6

IRQ5

TESTIN#

NAND Tree

Tri-state All Outputs

1110

5.2.

NAND Tree Mode

Tri-states all outputs and bi-directional buffers except for XDIR and DACK1#. Every output buffer except for

XDIR and DACK1# is configured as an input in NAND tree mode and included in the NAND chain. The first

input of the NAND chain is MDRQ1, and the NAND chain is routed counter-clockwise around the chip (e.g.,

MDRQ1, MDRQ0, MDAK1#, . . .). DACK1# is an intermediate output, and XDIR is the final output. PCICLK

and TESTIN# are the only input pins not included in the NAND chain. Note in the table above there are two

possible ways to select NAND tree test mode.

To perform a NAND tree test, all pins included in the NAND tree should be driven to 1 except for the following

pins, which use inverting Schmitt trigger inputs and should be driven to 0:

Table 18. Perform NAND Tree Test (Pins Driven To 0)

Pin #

Pin Name

IRQ1

IRQ8#

IOCHK#

IRQ9

ZEROWS#

IRQ7

IRQ6

IRQ5

IRQ4

IRQ3

IRQ10

IRQ11

IRQ12

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