| Motore di ricerca datesheet componenti elettronici |
|
PIIX Scheda tecnica(PDF) 119 Page - Intel Corporation |
|
|
|||||||||||||||||||||||||||||
PIIX Scheda tecnica(HTML) 119 Page - Intel Corporation |
|
119 / 122 page ![]() E 82371FB (PIIX) AND 82371SB (PIIX3) 119 Table 18. Perform NAND Tree Test (Pins Driven To 0) Pin # Pin Name 81 IRQ15 83 IRQ14 126 PWROK Beginning with MDRQ and working counter-clockwise around the chip, each pin can be toggled and a resulting toggle observed on DACK1# or XDIR. The DACK1# output is provided so that the NAND tree test can be divided into two sections. Table 19. NAND Tree Pin # Pin Name Notes 134 TESTIN# TESTIN# should be driven to 0 for the duration of the NAND tree test. 32 IRQ7 Test mode select signal. 33 IRQ6 Test mode select signal. 34 IRQ5 Test mode select signal. 142 MDRQ1 143 MDRQ0 144 MDK1 145 MDK0 146 MIRQ1 147 MIRQ0 148 RTCALE 149 PIRQA# 150 PIRQB# 151 PIRQC# 152 PIRQD# 153 SYSCLK 154 IDSEL 159 AD31 160 AD30 161 AD29 162 AD28 163 AD27 164 AD26 165 AD25 Table 19. NAND Tree Pin # Pin Name Notes 166 AD24 167 C/BE3# 168 AD23 171 AD22 172 AD21 173 AD20 174 AD19 175 AD18 176 AD17 177 AD16 178 C/BE2# 179 FRAME# 180 IRDY# 181 TRDY# 184 DEVSEL# 185 STOP# 186 PAR 187 C/BE1# 188 AD15 189 AD14 190 AD13 191 AD12 192 AD11 193 AD10 194 AD9 197 AD8 |
|
Link URL |
| Lei ha avuto il aiuto da alldatasheet? [ DONATE ] |
Di alldatasheet | Richest di pubblicita | contatti | Privacy Policy | Collegamento alla scheda tecnica | scambio Link | Ricerca produttore All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |