| Motore di ricerca datesheet componenti elettronici |
|
ISL73847SEHDEMO2Z Scheda tecnica(PDF) 38 Page - Renesas Technology Corp |
|
|
|||||||||||||||||||||||||||||
ISL73847SEHDEMO2Z Scheda tecnica(HTML) 38 Page - Renesas Technology Corp |
|
38 / 40 page ![]() R34DS0017EU0104 Rev.1.04 Page 38 Jan 31, 2025 ISL73041SEH Datasheet 10. Ordering Information 11. Revision History Part Number[1] 1. These Pb-free Hermetic packaged products employ 100% Au plate - e4 termination finish, which is RoHS compliant and compatible with both SnPb and Pb-free soldering operations. Radiation Hardness (Total Ionizing Dose) Package Description (RoHS Compliant) Package Drawing Carrier Type Temp Range ISL73041SEHML LDR to 75krad(Si) 16 Pad CLCC Packaged Device (QML-V Level Screening) J16.A Tray -55 to +125°C ISL73041SEHMX[2] 2. Die product tested at TA = + 25°C. The wafer probe test includes functional and parametric testing sufficient to make the die capable of meeting the electrical performance outlined in Electrical Specifications. The die is sourced from wafer lots that have been qualified for Group C and Group E per MIL-PRF-38535 (Refer to R34TB0001: Renesas Radiation Hardened QML-V Equivalent Screening and QCI Flow for more information). Bare Die (QML-V Level Screening) N/A N/A ISL73041SEHX/SAMPLE[2][3] 3. The /PROTO and /SAMPLE are not rated or certified for Total Ionizing Dose (TID) or Single Event Effect (SEE) immunity. These parts are intended for engineering evaluation purposes only. The /PROTO parts meet the electrical limits and conditions across temperature specified in this datasheet. The /SAMPLE parts are capable of meeting the electrical limits and conditions specified in this datasheet. The /SAMPLE parts do not receive 100% screening across temperature to the electrical limits. These part types do not come with a Certificate of Conformance. N/A Die N/A N/A ISL73041SEHL/PROTO[3] 16 Pad CLCC Packaged Device J16.A Tray ISL73041SEHEV1Z[4] 4. Evaluation board uses the /PROTO parts and /PROTO parts are not rated or certified for Total Ionizing Dose (TID) or Single Event Effect (SEE) immunity. ISL73041SEH Evaluation Board ISL73847SEHEV2Z[4] ISL73847SEH + ISL73041SEH Evaluation Board ISL73847SEHDEMO2Z[4] ISL73847SEH + ISL73041SEH Business Card Size Demonstration board with Package GaN FETs; VIN = 12V; VOUT = 1V; IOUT = 50A; fSW = 500kHz; Rev. Date Description 1.04 Jan 31, 2025 Updated the PGND and SGND pin descriptions. Added SGND to PGND parameter spec to Abs max section. Updated the Layout Guidelines section. 1.03 Jan 4, 2024 Updated Features bullets. Added Dual Complimentary Low-Side GaN FET Driver section. 1.02 Jun 22, 2023 Updated Figure 14. Updated Ordering Information table. |
|
Link URL |
| Lei ha avuto il aiuto da alldatasheet? [ DONATE ] |
Di alldatasheet | Richest di pubblicita | contatti | Privacy Policy | Collegamento alla scheda tecnica | scambio Link | Ricerca produttore All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |