| Motore di ricerca datesheet componenti elettronici |
|
LM98640CVAL Scheda tecnica(PDF) 37 Page - Texas Instruments |
|
|
|||||||||||||||||||||||||||||
LM98640CVAL Scheda tecnica(HTML) 37 Page - Texas Instruments |
|
37 / 55 page ![]() 37 LM98640QML-SP www.ti.com SNAS461G – MAY 2010 – REVISED NOVEMBER 2018 Product Folder Links: LM98640QML-SP Submit Documentation Feedback Copyright © 2010–2018, Texas Instruments Incorporated Register Maps (continued) Table 5. Configuration Registers (continued) ADDRES S (BINARY) REGISTER TITLE (MNEMONIC) BASELINE (BINARY) REGISTER and BIT DESCRIPTION Bit 7 Bit 6 Bit 5 Bit 4 Bit 3 Bit 2 Bit 1 Bit 0 01 1100 PGA2 0110 0001 PGA Gain Value 01 1101 Reserved 0000 0000 Not Used 01 1110 Reserved 0000 0000 Not Used 01 1111 Reserved 0000 0000 Not Used TIMING CONFIGURATION 10 0000 Clamp Start 0000 1000 Not Used Clamp Start Index 10 0001 Clamp End 0001 1100 Not Used Clamp End Index 10 0010 Sample Start 0010 1000 Not Used Sample Start Index 10 0011 Sample End 0011 1100 Not Used Sample End Index 10 0100 Reserved 0011 0100 Reserved 10 0101 INCLK Range 0000 0010 Not Used INCLK Range Not Used Reserved 10 0110 Reserved 0000 0000 Not Used 10 0111 Reserved 0000 0000 Not Used 10 1000 DLL Configuration 0000 1111 Reserved DLL Reset 10 1001 Reserved 0000 0000 Not Used 10 1010 Reserved 0000 0000 Not Used 10 1011 Reserved 0000 0000 Not Used 10 1100 Reserved 0000 0000 Not Used 10 1101 Reserved 0000 0000 Not Used 10 1110 Reserved 0000 0000 Not Used 10 1111 Reserved 0000 0000 Not Used DIGITAL CONFIGURATION REGISTERS 11 0000 Test Pattern Start 0000 0000 Start Upper Bits 11 0001 Test Pattern Start 0000 0000 Start Lower Bits 11 0010 Test Pattern Width 0000 0000 Width Upper Bits 11 0011 Test Pattern Width 0000 0000 Width Lower Bits 11 0100 Test Pattern Control 0000 0000 Pattern Enable Pattern Mode Pseudo Random Enable Seed Enable Pattern Output Channel 11 0101 Test Pattern Pitch 0000 0000 Test Pattern Pitch 11 0110 Test Pattern Step 0000 0000 Test Pattern Step Code 11 0111 Test Pattern Channel Offset 0000 0000 Not Used Test Pattern Channel Offset 11 1000 Test Pattern Value 0000 0000 Pattern Upper Bits 11 1001 Test Pattern Value 0000 0000 Pattern Lower Bits 11 1010 Reserved 0000 0000 Not Used 11 1011 Reserved 0000 0000 Not Used 11 1100 Digital Configuration 0000 0000 Not Used Auto Read 11 1101 Test & Scan Control 0000 0000 Not Used Pattern Voting Enable U-Wire Voting Enable Not Used Test Reset Test Mode Not Used 11 1110 Device ID 0100 1000 Device Revision ID. Engineering samples might be x01 or x47. 11 1111 Reserved 0000 0000 Not Used |
|
Link URL |
| Lei ha avuto il aiuto da alldatasheet? [ DONATE ] |
Di alldatasheet | Richest di pubblicita | contatti | Privacy Policy | Collegamento alla scheda tecnica | scambio Link | Ricerca produttore All Rights Reserved©Alldatasheet.com |
| Russian : Alldatasheetru.com | Korean : Alldatasheet.co.kr | Spanish : Alldatasheet.es | French : Alldatasheet.fr | Italian : Alldatasheetit.com Portuguese : Alldatasheetpt.com | Polish : Alldatasheet.pl | Vietnamese : Alldatasheet.vn Indian : Alldatasheet.in | Mexican : Alldatasheet.com.mx | British : Alldatasheet.co.uk | New Zealand : Alldatasheet.co.nz |
|
Family Site : ic2ic.com |
icmetro.com |